會議論文

學年期 標題 Sdgs 更新時間
090 / 1 A Low Power All Digital If-Discriminator Design #09.產業創新與基礎設施 2010-06-16
091 / 1 A Data-Path Based Diagnosis Mechanism for RTL Description of VLSI Circuits #09.產業創新與基礎設施 2010-06-16
090 / 1 A TLS-Based Output Response Analyzer for BIST #09.產業創新與基礎設施 2010-06-16
091 / 1 An Efficient Test Strategy for Fast Multiplier Cores #09.產業創新與基礎設施 2010-06-16
092 / 1 An Efficient Low-Overhead Policy for Constructing Multiple Scan-Chains #09.產業創新與基礎設施 2010-06-16
092 / 1 The Optimal Layout-Based Multi-Scan-Chain Scheme #09.產業創新與基礎設施 2010-06-16
092 / 1 An Efficient Reseeding With Modifying Technique for Pseudo-Random-Based BIST #09.產業創新與基礎設施 2010-06-16
090 / 1 The methods to construct imaging circuit for efficient VLSI circuit verification #09.產業創新與基礎設施 2010-06-16
092 / 1 The TAM Architecture for Optimal Testing Scheduling of SOC #09.產業創新與基礎設施 2010-06-16
093 / 2 A novel reseeding mechanism for pseudo-random testing of VLSI circuits #09.產業創新與基礎設施 2015-08-04
094 / 2 A broadcast-based test scheme for reducing test size and application time #09.產業創新與基礎設施 2015-08-05
088 / 2 A timing-driven pseudo-exhaustive testing of VLSI circuits #10.減少不平等 2015-07-27
097 / 1 The Grid-Based Two-Layer Routing Algorithm Suitable for Cell/IP-Based Circuit Design #09.產業創新與基礎設施 2014-07-30
097 / 1 Test Slice Difference Technique for Low Power Testing #09.產業創新與基礎設施 2011-10-23
096 / 2 An Efficient Test-Data Compaction for Low Power VLSI Testing #09.產業創新與基礎設施 2011-10-23
096 / 1 A Novel High-Speed SOC Test Scheme Using Virtual TAMs #09.產業創新與基礎設施 2011-10-23
097 / 2 A Novel Clock Gating Scheme of Scan Chains for Capture Power Reduction #09.產業創新與基礎設施 2011-10-23
097 / 2 A Novel Constructive Data Compression Scheme for Shifting-in Power Reduction with Multiple Scan-chains Design #09.產業創新與基礎設施 2011-10-23
098 / 2 Multi-Chains Encoding Scheme in Low-Cost ATE #09.產業創新與基礎設施 2014-08-21
097 / 2 Reducing Switching Activity by Test Slice Difference Technique for Test Volume Compression #09.產業創新與基礎設施 2014-09-23
099 / 1 An Filling Methodology for Efficient Compaction of Test Responses with Unknowns #09.產業創新與基礎設施 2011-10-23
095 / 1 Design of Dynamically Assignmentable TAM Width for Testing Core-Based SOCs #09.產業創新與基礎設施 2014-10-15
098 / 2 Multi-Cycle Compress Technique for High-Speed IP in Low-Cost Environment #09.產業創新與基礎設施 2014-08-21
095 / 2 A New Algorithm for Latch-Up Check Based on Look-Up Table #09.產業創新與基礎設施 2011-10-23
098 / 1 A New Scheme of Reducing Shift and Capture Power Using the X-Filling Methodology #09.產業創新與基礎設施 2015-03-10
096 / 2 A New Double-edge Triggered Design with Low-power consumption and High-speed 2011-10-23
092 / 1 A Datapath-Based Debugging Mechanism for RTL Description #09.產業創新與基礎設施 2011-10-23
098 / 1 A Novel Gated Scan-Cell Scheme for Low Capture Power (LCP) in At-Speed Testing #09.產業創新與基礎設施 2011-10-23
097 / 1 An Efficient Scheduling Algorithm for Testing SOC with Multi-Frequency TAM 2011-10-23
094 / 1 智慧型無線光導盲杖導引系統暨導盲機器人之設計 #09.產業創新與基礎設施 2014-06-05
100 / 1 Multiple Inputs Selector for High-Speed Masking #09.產業創新與基礎設施 2013-07-25
101 / 1 Optimal Unknown Bit Filtering for Test Response Masking #09.產業創新與基礎設施 2014-08-13
101 / 1 An Efficient Test Data Compression Scheme Using Selection Expansion #09.產業創新與基礎設施 2013-07-25
101 / 1 Multimode ATPG for DVFS Designs #09.產業創新與基礎設施 2013-07-25
092 / 1 A Datapath-Based Debugging Mechanism for RTL Description #09.產業創新與基礎設施 2014-06-09
092 / 1 Pseudo-Exhaustively Testing VLSI Circuits Using Enhanced Tree-Structured Scan Chains #09.產業創新與基礎設施 2014-06-09
092 / 1 A Core-Based Test Methodology for Fast Multipliers #09.產業創新與基礎設施 2014-06-09
091 / 1 A Novel BIST Response Analyzer Based on TLS #09.產業創新與基礎設施 2014-06-06
093 / 1 An Efficient Low-Overhead Policy for Constructing Multiple Scan-Chains #09.產業創新與基礎設施 2014-06-06
096 / 2 A New Low Power, High Speed Double-Edge Triggered Flip-Flop #09.產業創新與基礎設施 2014-06-05
099 / 1 The AB-Filling Methodology for Power-aware At-Speed Scan Testing #09.產業創新與基礎設施 2015-03-10
091 / 2 An efficient mechanism for debugging RTL description #09.產業創新與基礎設施 2015-07-03
093 / 2 Reconfigurable multiple scan-chains for reducing test application time of SOCs #09.產業創新與基礎設施 2015-08-04
104 / 1 重分佈層之避障繞線演算法 #09.產業創新與基礎設施 2016-04-01
105 / 1 應用無線分散式演算法於重分佈避障之研究 #09.產業創新與基礎設施 2017-02-24
105 / 1 使用環形振盪器對TSV預接合測試 #09.產業創新與基礎設施 2017-02-24
106 / 2 Low-Capture-Power X-filling Method Based On Architecture Using Selection Expansion #09.產業創新與基礎設施 2019-05-13
108 / 1 一種基於測試模式特性的低功耗測試架構 #09.產業創新與基礎設施 2020-03-20
108 / 1 測試壓縮運用單輸入通道和多個擴展比 #09.產業創新與基礎設施 2020-03-20
110 / 1 A Scan-Based Lower-Power Testing Architecture for Modern Circuits 2022-03-07
110 / 1 基於EfficientNet之導引式雙層網路應用於超解析度影像 2022-03-07
111 / 2 基於 Mask R-CNN 的汽車圖像分割 2024-03-19
113 / 1 A Hierarchical Tree-Structured Control Digital Low Drop-out Regulator with Status-Dumping Mechanism 2025-01-14