會議論文
| 學年 | 98 |
|---|---|
| 學期 | 1 |
| 發表日期 | 2009-11-23 |
| 作品名稱 | A New Scheme of Reducing Shift and Capture Power Using the X-Filling Methodology |
| 作品名稱（其他語言） | |
| 著者 | Chen, Tsung-tang; Li, Wei-lin; Wu, Po-han; Rau, Jiann-chyi |
| 作品所屬單位 | 淡江大學電機工程學系 |
| 出版者 | |
| 會議名稱 | 2009 Asian Test Symposium(ATS '09) |
| 會議地點 | Taichung, Taiwan |
| 摘要 | A scheme that ATPG-based technique for reducing shift and capture power during scan testing is presented without any influence on fault coverage. This paper presents an X-filling approach called Adjacent Backtracing fill (AB-fill). After AB-fill approach for at-speed scan testing, all of test patterns have assigned as partially-specified values with a small number of don’t care bits (x) as in test compression, and it is integrated in the ATPG algorithm to reduce capture power while feeding the first test pattern into CUT. |
| 關鍵字 | At-Speed Scan Testing; DFT; X-Filling |
| 語言 | en_US |
| 收錄於 | |
| 會議性質 | 國際 |
| 校內研討會地點 | |
| 研討會時間 | 20091123~20091126 |
| 通訊作者 | |
| 國別 | TWN |
| 公開徵稿 | Y |
| 出版型式 | 紙本 |
| 出處 | Proceedings of 2009 Asian Test Symposium(ATS '09), pp.105-110 |
| 相關連結 |
機構典藏連結 ( http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/70265 ) |