會議論文
| 學年 | 97 |
|---|---|
| 學期 | 2 |
| 發表日期 | 2009-05-24 |
| 作品名稱 | Reducing Switching Activity by Test Slice Difference Technique for Test Volume Compression |
| 作品名稱（其他語言） | |
| 著者 | Li, Wei-Lin; Wu, Po-Han; Rau, Jiann-Chyi |
| 作品所屬單位 | 淡江大學電機工程學系 |
| 出版者 | IEEE Circuits and Systems Society; National Cheng Kung University |
| 會議名稱 | |
| 會議地點 | Taipei, Taiwan |
| 摘要 | This paper presents a test slice difference (TSD) technique to improve test data compression. It is an efficient method and only needs one scan cell. Consequently, hardware overhead is much lower than cyclical scan chains (CSR). As the complexity of VLSI continues to grow, excessive power supply noise has become seriously. We propose a new compression scheme which smooth down the switching activity and reduce the test data volume simultaneously. |
| 關鍵字 | |
| 語言 | en |
| 收錄於 | |
| 會議性質 | 國際 |
| 校內研討會地點 | |
| 研討會時間 | |
| 通訊作者 | |
| 國別 | TWN |
| 公開徵稿 | |
| 出版型式 | |
| 出處 | Proc. of IEEE International Symposium on Circuits and Systems (ISCAS), pp.2986-2989 |
| 相關連結 |
機構典藏連結 ( http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/70543 ) |