A novel design for a burn-in system
學年 100
學期 2
出版（發表）日期 2012-04-15
作品名稱 A novel design for a burn-in system
作品名稱（其他語言）
著者 Li, Shin-an; Chiang, Jen-shiun; Liu, Ta-kang; Chen, Kuang-yuan; Wong, Ching-chang
單位 淡江大學電機工程學系
出版者 American Scientific Publishers
著錄名稱、卷期、頁數 Advance Science Letters 8, pp.106-111
摘要 Burn-in test is helpful to improve the reliability of Integrated Circuit (IC). It can screen the early failures of the IC and get a good quality. When the IC technology enters deep sub-micron technologies, the increased standby leakage current will cause the higher junction temperature. The high junction temperature in the CMOS circuit may lead to thermal runaway and yield loss during burn-in test. It is a challenge to keep a uniform temperature in the burn-in system. In this paper, a modified burn-in socket and a fuzzy control structure are proposed to solve the non-uniform temperature in the burn-in system. First, a burn-in socket, which has a heater to raise the temperature and a fan to lower the temperature, is proposed and implemented. Using the modified socket, every Device Under Test (DUT) has its own temperature control system. Then, a fuzzy control structure is proposed to control the heater and fan to adjust the temperature of the DUT. From the experiment, the implemented burn-in system has a fast response time and an excellent dynamic balancing.
關鍵字 BURN-IN TEST;FUZZY CONTROL;INTEGRATED CIRCUIT TEST;PI CONTROL
語言 en_US
ISSN 1936-7317
期刊性質 國外
收錄於 SCI
產學合作
通訊作者
審稿制度 是
國別 USA
公開徵稿
出版型式 ,電子版,紙本
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