教師資料查詢 | 類別: 期刊論文 | 教師: 翁慶昌WONG CHING-CHANG (瀏覽個人網頁)

標題:A novel design for a burn-in system
學年100
學期2
出版(發表)日期2012/04/15
作品名稱A novel design for a burn-in system
作品名稱(其他語言)
著者Li, Shin-an; Chiang, Jen-shiun; Liu, Ta-kang; Chen, Kuang-yuan; Wong, Ching-chang
單位淡江大學電機工程學系
出版者American Scientific Publishers
著錄名稱、卷期、頁數Advance Science Letters 8, pp.106-111
摘要Burn-in test is helpful to improve the reliability of Integrated Circuit (IC). It can screen the early failures of the IC and get a good quality. When the IC technology enters deep sub-micron technologies, the increased standby leakage current will cause the higher junction temperature. The high junction temperature in the CMOS circuit may lead to thermal runaway and yield loss during burn-in test. It is a challenge to keep a uniform temperature in the burn-in system. In this paper, a modified burn-in socket and a fuzzy control structure are proposed to solve the non-uniform temperature in the burn-in system. First, a burn-in socket, which has a heater to raise the temperature and a fan to lower the temperature, is proposed and implemented. Using the modified socket, every Device Under Test (DUT) has its own temperature control system. Then, a fuzzy control structure is proposed to control the heater and fan to adjust the temperature of the DUT. From the experiment, the implemented burn-in system has a fast response time and an excellent dynamic balancing.
關鍵字BURN-IN TEST;FUZZY CONTROL;INTEGRATED CIRCUIT TEST;PI CONTROL
語言英文(美國)
ISSN1936-7317
期刊性質國外
收錄於SCI;
產學合作
通訊作者
審稿制度
國別美國
公開徵稿
出版型式,電子版,紙本
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