期刊論文
| 學年 | 100 |
|---|---|
| 學期 | 2 |
| 出版（發表）日期 | 2012-04-15 |
| 作品名稱 | A novel design for a burn-in system |
| 作品名稱（其他語言） | |
| 著者 | Li, Shin-an; Chiang, Jen-shiun; Liu, Ta-kang; Chen, Kuang-yuan; Wong, Ching-chang |
| 單位 | 淡江大學電機工程學系 |
| 出版者 | American Scientific Publishers |
| 著錄名稱、卷期、頁數 | Advance Science Letters 8, pp.106-111 |
| 摘要 | Burn-in test is helpful to improve the reliability of Integrated Circuit (IC). It can screen the early failures of the IC and get a good quality. When the IC technology enters deep sub-micron technologies, the increased standby leakage current will cause the higher junction temperature. The high junction temperature in the CMOS circuit may lead to thermal runaway and yield loss during burn-in test. It is a challenge to keep a uniform temperature in the burn-in system. In this paper, a modified burn-in socket and a fuzzy control structure are proposed to solve the non-uniform temperature in the burn-in system. First, a burn-in socket, which has a heater to raise the temperature and a fan to lower the temperature, is proposed and implemented. Using the modified socket, every Device Under Test (DUT) has its own temperature control system. Then, a fuzzy control structure is proposed to control the heater and fan to adjust the temperature of the DUT. From the experiment, the implemented burn-in system has a fast response time and an excellent dynamic balancing. |
| 關鍵字 | BURN-IN TEST;FUZZY CONTROL;INTEGRATED CIRCUIT TEST;PI CONTROL |
| 語言 | en_US |
| ISSN | 1936-7317 |
| 期刊性質 | 國外 |
| 收錄於 | SCI |
| 產學合作 | |
| 通訊作者 | |
| 審稿制度 | 是 |
| 國別 | USA |
| 公開徵稿 | |
| 出版型式 | ,電子版,紙本 |
| 相關連結 |
機構典藏連結 ( http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/78136 ) |