| 100 / 2 |
Test Slice Difference Technique for Low-Transition Test Data Compression
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2024-03-01 |
| 099 / 2 |
An Efficient Algorithm to Selectively Gate Scan Cells for Capture Power Reduction
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2016-12-21 |
| 099 / 1 |
Power-aware multi-chains encoding scheme for system-on-a-chip in low-cost environment
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2015-01-22 |
| 099 / 2 |
Power-aware compression scheme for multiple scan-chain
|
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2015-02-04 |
| 096 / 2 |
An Efficient Scheduling Algorithm Based On Multi-frequency TAM for SOC Testing
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2015-03-05 |
| 096 / 2 |
A Novel Reseeding Mechanism for Improving Pseudo-Random Testing of VLSI Circuits
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2015-04-21 |
| 099 / 1 |
Optimal Test Access Mechanism (TAM) for Reducing Test Application Time of Core-Based SOCs
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2017-03-08 |