Improving electrochromic properties of V2O5 smart film through Ti incorporation: local atomic and electronic perspectives
學年 112
學期 2
出版(發表)日期 2024-05-01
作品名稱 Improving electrochromic properties of V2O5 smart film through Ti incorporation: local atomic and electronic perspectives
作品名稱(其他語言)
著者 I-Han Wu;Arvind Chandrasekar;Kumaravelu Thanigai Arul ;Yu-Cheng Huang;Ta Thi Thuy Nga;Chi-Liang Chen;Jeng-Lung Chen;Da-Hua Wei d;Kandasami Asokan;Ping-Hung Yeh;Chao-Hung Du;Wu-Ching Chou;Chung-Li Dong
單位
出版者
著錄名稱、卷期、頁數 Optical Materials: X 22, p.100301
摘要 In this work, vanadium pentoxide (V2O5) and titanium-modified V2O5 thin films were synthesized using the sol-gel spin coating route. The effect of Ti-doping concentration on the electrochromic optical properties and atomic/electronic structures of V2O5 smart thin films is examined. As the doping concentration of Ti increases, the surface roughness of the films is reduced. The structure of the films is analyzed using X-ray diffraction (XRD) and Raman spectroscopy, while the electrochromic modulation of atomic and electronic structures is elucidated through Raman and X-ray absorption spectroscopy (XAS) conducted during lithiation and delithiation. The XRD patterns demonstrate that an increase in Ti concentration leads to a more amorphous structure of the films and a shift of the main diffraction peak to a lower angle, attributable to the enlarged spacing between the stacking layers resulting from the incorporation of Ti ions. Soft X-ray absorption spectroscopy (XAS) and in situ hard XAS of the V L-edge, the O K-edge, and the V K-edge revealed a reduction in the charge state of V and local atomic structural symmetry modification upon lithated coloration and delithiated bleaching process. The critical insights provided by in situ XAS provides reveal that a small amount of Ti has the ability to modify the interlayer distance and local atomic structure of V2O5, thereby improving its electrochromic switching rate and stability when utilized in smart windows.
關鍵字 X-ray absorption spectroscopy;In situ x-ray absorption spectroscopy;Electronic structure;Atomic structure;Smart window;Electrochromism
語言 zh_TW
ISSN
期刊性質 國外
收錄於 ESCI
產學合作
通訊作者
審稿制度
國別 GBR
公開徵稿
出版型式 ,電子版,紙本
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機構典藏連結 ( http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/127758 )