Effects of surface diffusion and solder volume on porous-type Cu3Sn in Cu/ Sn/Cu microjoints
學年 110
學期 1
出版(發表)日期 2022-01-01
作品名稱 Effects of surface diffusion and solder volume on porous-type Cu3Sn in Cu/ Sn/Cu microjoints
作品名稱(其他語言)
著者 Y. W. Wang
單位
出版者
著錄名稱、卷期、頁數 Materials Chemistry and Physics 275, 125307
摘要 High-density interconnection technology is critical for semiconductor packages, which require high speed and multifunctional demands. The shrinkage of solder volume is needed for the miniaturization of devices. Fewer studies investigate using Cu3Sn than Cu6Sn5 in large solder joints. However, Cu3Sn has a significant and critical effect on microjoints. Cu6Sn5 can transform completely to Cu3Sn, which may cause unexpected problems in microjoints. The interfacial reactions in large and small solder joints are different. Porous-type Cu3Sn is an unusual structure at the interface. In this study, we utilize the transient liquid-phase bonding (TLP) process on microbumps to drive the transformation of Cu6Sn5 to Cu3Sn. Porous-type Cu3Sn is loose and unfavorable for joint strength. High-temperature bonding, microbumps and flux residues induce porous structure formation.
關鍵字 Semiconductor package;Microjoint;Porous-type Cu3Sn
語言 en
ISSN 0254-0584;1879-3312
期刊性質 國外
收錄於 SCI
產學合作
通訊作者 Y. W. Wang (王儀雯)
審稿制度
國別 NLD
公開徵稿
出版型式 ,電子版,紙本