Imaging of Rough Surfaces by Near-Field Measurement
學年 109
學期 2
出版（發表）日期 2021-07-06
作品名稱 Imaging of Rough Surfaces by Near-Field Measurement
作品名稱（其他語言）
著者 Wei Chien; Chien-Ching Chiu; Po-Hsiang Chen; Hao Jiang; Shun-Jie Chan
單位
出版者
著錄名稱、卷期、頁數 Sensors and Materials 33(7), p.2333-2344
摘要 We have studied the near-field measurement of periodic non-flat surfaces and compared the error between the near-field and far-field measurements. Using known boundary conditions and recorded scattering data, we derived a group of matrix functions that can be converted into an external problem, and then used the self-adaptive dynamic differential evolution (SADDE) method to recover the shape, periodic length, and dielectric constant of surfaces. We compared the search speed and stability of the surface reconstruction. The SADDE converges to the global extreme regardless of the initial guess. In a numerical simulation, even if the initial estimate was much larger than the true value, we could still find an accurate numerical solution and successfully reconstruct the surface shape function, period length, and relative dielectric constant. The simulation results show that the error in the near-field measurement is smaller than that in the far-field measurement.
關鍵字 microwave imaging;near-field measurement;rough surfaces;self-adaptive dynamic differential evolution (SADDE)
語言 en
ISSN 2435-0869
期刊性質 國外
收錄於 SCI EI
產學合作
通訊作者 C. C. Chiu
審稿制度 是
國別 JPN
公開徵稿
出版型式 ,電子版,紙本
相關連結

機構典藏連結 ( http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/122371 )