Lifetime Inference for Highly Reliable Products Based on Skew-Normal Accelerated Destructive Degradation Test Model
學年 108
學期 1
發表日期 2019-12-14
作品名稱 Lifetime Inference for Highly Reliable Products Based on Skew-Normal Accelerated Destructive Degradation Test Model
作品名稱（其他語言）
著者 Tsai, C. C.; Lin, C. T.
作品所屬單位
出版者
會議名稱 108年中國統計學社社員大會暨統計學術研討會
會議地點 Hsinchu, Taiwan
摘要 The accelerated destructive degradation test (ADDT) method provides an effective way to assess the reliability information of highly reliable products whose quality characteristics degrade over time, and can be taken only once on each tested unit during the measurement process. Conventionally, engineers assume that the measurement error follows the normal distribution. However, degradation models based on this normality assumption often do not apply in practical applications. To relax the normality assumption, the skew-normal distribution is adopted in this study because it preserves the advantages of the normal distribution with the additional benefit of flexibility with regard to skewness and kurtosis. Here, motivated by polymer data, we propose a skew-normal nonlinear ADDT model, and derive the analytical expressions for the product's lifetime distribution along with its corresponding pth percentile. Then, the polymer data are used to illustrate the advantages gained by the proposed model.
關鍵字 Accelerated destructive degradation tests;expectation-maximization algorithm;highly reliable products;skew-normal distribution
語言 zh_TW
收錄於
會議性質 國內
校內研討會地點 無
研討會時間 20191214~20191214
通訊作者
國別 TWN
公開徵稿
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出處
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機構典藏連結 ( http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/120114 )

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