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標題:Lifetime Inference for Highly Reliable Products Based on Skew-Normal Accelerated Destructive Degradation Test Model
學年108
學期1
發表日期2019/12/14
作品名稱Lifetime Inference for Highly Reliable Products Based on Skew-Normal Accelerated Destructive Degradation Test Model
作品名稱(其他語言)
著者Tsai, C. C.; Lin, C. T.
作品所屬單位
出版者
會議名稱108年中國統計學社社員大會暨統計學術研討會
會議地點Hsinchu, Taiwan
摘要The accelerated destructive degradation test (ADDT) method provides an effective way to assess the reliability information of highly reliable products whose quality characteristics degrade over time, and can be taken only once on each tested unit during the measurement process. Conventionally, engineers assume that the measurement error follows the normal distribution. However, degradation models based on this normality assumption often do not apply in practical applications. To relax the normality assumption, the skew-normal distribution is adopted in this study because it preserves the advantages of the normal distribution with the additional benefit of flexibility with regard to skewness and kurtosis. Here, motivated by polymer data, we propose a skew-normal nonlinear ADDT model, and derive the analytical expressions for the product's lifetime distribution along with its corresponding pth percentile. Then, the polymer data are used to illustrate the advantages gained by the proposed model.
關鍵字Accelerated destructive degradation tests;expectation-maximization algorithm;highly reliable products;skew-normal distribution
語言中文
收錄於
會議性質國內
校內研討會地點
研討會時間20191214~20191214
通訊作者
國別中華民國
公開徵稿
出版型式
出處
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