Boosting the Profitability of NVRAM-based Storage Devices via the Concept of Dual-Chunking Data Deduplication | |
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學年 | 108 |
學期 | 1 |
發表日期 | 2020-01-13 |
作品名稱 | Boosting the Profitability of NVRAM-based Storage Devices via the Concept of Dual-Chunking Data Deduplication |
作品名稱(其他語言) | |
著者 | Shuo-Han Chen; Yu-Pei Liang; Yuan-Hao Chang; Hsin-Wen Wei; Wei-Kuan Shih |
作品所屬單位 | |
出版者 | |
會議名稱 | ASP-DAC 2020 |
會議地點 | Beijing, China |
摘要 | With the latest advance in the non-volatile random-access memory (NVRAM), NVRAM is widely considered as the mainstream for the next-generation storage mediums. NVRAM has numerous attractive features, which include byte addressability, limited idle energy consumption, and great read/write access speed. However, owing to the high manufacturing cost of NVRAM, the incentive of deploying NVRAM in consumer electronics is lowered due to the consideration of profitability. To resolve the profitability issue and bring the benefits of NVRAM into the design of consumer electronics, avoiding storing duplicate data on NVRAM becomes a crucial task for lowering the demand and deployment cost of NVRAM. Such observation motivates us to propose a data deduplication extended file system design (DeEXT) to boost the profitability of NVRAM via the concept of dual-chunking data deduplication while considering the characteristics of NVRAM and duplicate data content. The proposed DeEXT was then evaluated by real-world data deduplication traces with encouraging results. |
關鍵字 | Random access memory;Nonvolatile memory;Power capacitors;Performance evaluation;Indexing;Consumer electronics;Three-dimensional displays |
語言 | en_US |
收錄於 | |
會議性質 | 國際 |
校內研討會地點 | 無 |
研討會時間 | 20200113~20200116 |
通訊作者 | |
國別 | CHN |
公開徵稿 | |
出版型式 | |
出處 | 2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC) |
相關連結 |
機構典藏連結 ( http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/118999 ) |