Reliability Inference for VGA Adapter from Dual Suppliers Based on Contaminated Type-I Interval-Censored Data
學年 107
學期 2
出版（發表）日期 2019-06-24
作品名稱 Reliability Inference for VGA Adapter from Dual Suppliers Based on Contaminated Type-I Interval-Censored Data
作品名稱（其他語言）
著者 Tzong-Ru Tsai, Hon Keung Tony Ng, Hoang Pham, Yuhlong Lio, Jyun-You Chiang
單位
出版者
著錄名稱、卷期、頁數 Quality and Reliability Engineering International 35(7), p.2297-2313
摘要 Type‐I interval‐censoring scheme only documents the number of failed units within two prespecified consecutive exam times at the larger time point after putting all units on test at the initial time schedule. It is challenging to use the collected information from type‐I interval‐censoring scheme to evaluate the reliability of unit when not all admitted units are operated or tested at the same initial time and a majority of units are randomly selected to replace the failed test units at unrecorded time points. Moreover, the lifetime distribution of all pooled units from dual resources usually follows a mixture distribution. To overcome these two problems, a two‐stage inference process that consists of a data‐cleaning step and a parameter estimation step via either Markov chain Monte Carlo (MCMC) algorithm or profile likelihood method is proposed based on the contaminated type‐I interval‐censored sample from a mixture distribution with unknown proportion. An extensive simulation study is conducted under the mixture smallest extreme value distributions to evaluate the performance of the proposed method for a case study. Finally, the proposed methods are applied to the mixture lifetime distribution modeling of video graphics array adapters for the support of reliability decision.
關鍵字 Bayesian method;location‐scale distribution;Metropolis‐Hastings algorithm;profile likelihood; Weibull distribution
語言 en
ISSN 1099-1638
期刊性質 國外
收錄於 SCI Scopus
產學合作
通訊作者
審稿制度 否
國別 GBR
公開徵稿
出版型式 ,電子版
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