Lifetime Inference for Highly Reliable Products Based on Skew-Normal Accelerated Destructive Degradation Test Model
學年 107
學期 1
申請日期 2018-08-01
得獎人員 蔡志群 CHIH-CHUN TSAI
得獎論文名稱 Lifetime Inference for Highly Reliable Products Based on Skew-Normal Accelerated Destructive Degradation Test Model
得獎等級 0
所屬類別 0
出版者 IEEE Transactions on Reliability 64(4), p.1340-1355
研究獎勵類別 5
備註
發表日期 2015-01-01