A High-Resolution All-Digital Temperature Sensor with Process Variation Compensation
學年 104
學期 2
出版（發表）日期 2016-05-25
作品名稱 A High-Resolution All-Digital Temperature Sensor with Process Variation Compensation
作品名稱（其他語言）
著者 Yu-Lung Lo; Wei-Tsuen Chen; Yu-Ting Chiu; Wei-Bin Yang,
單位
出版者
著錄名稱、卷期、頁數 Sensors and Materials 28(5), p.395–402
摘要 In this paper, we propose a high-resolution all-digital complementary metal–oxide semiconductor (CMOS) temperature sensor with a ring oscillator for temperature sensing and power supply immunity, a time amplifier for process variation compensation, and serial digital output for low area consumption. Because of the linearity of its high output cycle–temperature, the sensor has excellent measurement accuracy; the architecture of the sensor effectively decreased power supply sensitivity, and the parallel-to-serial converter considerably reduced area consumption. In addition, the high resolution is determined by the time amplifier with external digital codes. The determination of resolution using the time amplifier and the process variation compensation were accomplished simultaneously. The temperature sensor was fabricated using 0.18-μm standard CMOS technology, and the core circuit occupies an area of 0.001 mm2. The experimental results indicated that the energy per conversion rate was only 10 nJ at a supply voltage of 1.8 V; the conversion rate was 15–30 k samples/s, and the error in temperature sensing ranged from −1.58 to +1.6 °C with a resolution higher than 0.1 °C after one-point calibration in the −40 to +130 °C range. With these advantages, the temperature sensor is suitable for application in large integrated circuit (IC) systems and three-dimensional ICs.
關鍵字 CMOS temperature sensor; thermal sensor; ring oscillator; all digital; process variation compensation
語言 en_US
ISSN
期刊性質 國外
收錄於 SCI EI
產學合作
通訊作者
審稿制度 是
國別 JPN
公開徵稿
出版型式 ,電子版
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