Testing for multiple upper and lower outliers in an exponential sample
學年 105
學期 2
出版（發表）日期 2017-05-01
作品名稱 Testing for multiple upper and lower outliers in an exponential sample
作品名稱（其他語言）
著者 Nirpeksh Kumar; Chien-Tai Lin
單位
出版者
著錄名稱、卷期、頁數 Journal of Statistical Computation and Simulation 87(5), p.870-881
摘要 Due to wide applicability and simplicity, the exponential distribution is the most commonly used distribution in reliability engineering and other life testing experiments. In this paper a test statistic for testing upper and lower outliers simultaneously in an exponential sample is proposed. However, the distribution of test statistic under the alternative is rather intricate, the null distribution is derived and critical values are obtained. A simulation study is also carried out to compare the performance of test and is found that the test based on this statistic is more powerful than the other two selected tests.
關鍵字 Reliability; outlier; slippage alternative; discordancy; performance
語言 en
ISSN 1563-5163
期刊性質 國外
收錄於 SCI
產學合作
通訊作者 Nirpeksh Kumar
審稿制度 是
國別 GBR
公開徵稿
出版型式 ,電子版
相關連結

機構典藏連結 ( http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/108279 )