| Study for Reaching a Degradation Test Plan | |
|---|---|
| 學年 | 104 |
| 學期 | 2 |
| 發表日期 | 2016-03-26 |
| 作品名稱 | Study for Reaching a Degradation Test Plan |
| 作品名稱（其他語言） | |
| 著者 | Tsai, Tzong-Ru; Lio, Y. L. |
| 作品所屬單位 | |
| 出版者 | |
| 會議名稱 | The 4th IIAE International Conference on Industrial Application Engineering 2016 |
| 會議地點 | Beppu, Japan |
| 摘要 | In this paper, we study the merits and drawbacks of using the algorithm proposed by Tsai et al.(1) to obtain optimal sample size allocation and termination times of a twovariable constant-stress accelerated degradation test plan under the stochastic process of Gamma. A simulation example of light emitting diodes is used for illustrating the implementation of the algorithm. |
| 關鍵字 | Brownian motion process;Gamma process;geometric Brownian motion process;generalized Eyring model;inverse Gaussian distribution |
| 語言 | en |
| 收錄於 | |
| 會議性質 | 國際 |
| 校內研討會地點 | 無 |
| 研討會時間 | 20160326~20160330 |
| 通訊作者 | Tsai, Tzong-Ru |
| 國別 | JPN |
| 公開徵稿 | |
| 出版型式 | |
| 出處 | Proceedings of The 4th IIAE International Conference on Industrial Application Engineering 2016 |
| 相關連結 |
機構典藏連結 ( http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/107573 ) |
| SDGS | 優質教育,夥伴關係 |
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