教師資料查詢 | 類別: 會議論文 | 教師: 蔡志群 Chih-chun Tsai (瀏覽個人網頁)

標題:Optimal Design for Accelerated-Stress Acceptance Test Based on Wiener Process
學年
學期
發表日期2015/08/08
作品名稱Optimal Design for Accelerated-Stress Acceptance Test Based on Wiener Process
作品名稱(其他語言)
著者Tsai, C. C.; Balakrishnan, N.; Lin, C. T.
作品所屬單位
出版者
會議名稱2015Joint Statistical Meetings
會議地點Washington, U.S.A.
摘要Acceptance testing is widely used to assess whether a product meets the expectations of customers. Yet, traditional acceptance tests based on time-to-failure data will not be practical because today's highly reliable products may take a long time to fail. It may be good in this case to base a test on a suitable quality characteristic (QC) whose degradation over time is related to the reliability of the product. Motivated by resistor data, we first propose a degradation model to describe the degradation paths of the resistors. Next, we present an accelerated-stress acceptance test to reduce the acceptance testing time, and then derive the optimal accelerated-stress acceptance testing time for a product, and the probability of acceptance of the batch. A model incorporating cost is also used to determine the optimal design for an accelerated-stress acceptance experiment, and a motivating example is then presented to illustrate the proposed procedure. Finally, we examine the performance of the estimators, and the effect of misspecification of the parameters on the optimal test plan through a Monte Carlo simulation study, and a detailed sensitivity analysis.
關鍵字
語言英文(美國)
收錄於
會議性質國際
校內研討會地點
研討會時間20150808~20150813
通訊作者Tsai, C. C.
國別美國
公開徵稿
出版型式
出處IEEE Transactions on Reliability 64(2), pp.603-612
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