Warranty-aware page management for PCM-based embedded systems
學年 103
學期 1
發表日期 2014-11-02
作品名稱 Warranty-aware page management for PCM-based embedded systems
作品名稱（其他語言）
著者 Cheng, Sheng-Wei; Chang, Yu-Fen; Chang, Yuan-Hao; Wei, Hsin-Wen; Shih, Wei-Kuan
作品所屬單位 淡江大學電機工程學系
出版者 IEEE Press Piscataway
會議名稱 The 33rd IEEE/ACM 2014 International Conference on Computer-Aided Design (ICCAD)
會議地點 San Jose, USA
摘要 The thriving growth in mobile consumer electronics makes energy efficiency in the embedded system design an important and recurring theme. Phase Change Memory (PCM) has shown its potential in replacing DRAM as the main memory option due to its (65%) reduced energy requirements. However, when considering the usage of PCM main memory, its write endurance becomes a critical issue, and wear leveling design is a common approach to resolve this issue. Even though the wear leveling design should stress operation efficiency and overhead reduction, existing wear leveling strategies designed for PCM main memory are usually dedicated to prolonging the lifetime of PCM. In this paper, we propose the perspective that, instead of valuing PCM lifetime exploitation as the first priority, we should turn to satisfy the product warranty period. To this end, further enhancement of operation efficiency and reduction of management overhead could be achieved. We thus propose a warranty-aware page management design to enhance the operation efficiency for managing the endurance issue in PCM. To show the effectiveness of the proposed design, we collected real traces on fiasco.OC by running SPEC2006 benchmarks with different write intensity workloads. The experiment results showed that our design reduced the overhead to one third of that of the state-of-the-art designs while still providing the same level of performance.
關鍵字
語言 en_US
收錄於
會議性質 國際
校內研討會地點
研討會時間 20141102~20141106
通訊作者
國別 USA
公開徵稿 Y
出版型式 紙本
出處 Proceedings of the 2014 IEEE/ACM International Conference on Computer-Aided Design, pp.734-741
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