A new process capability analysis chart approach on the chip resistor quality management
學年 101
學期 2
出版（發表）日期 2013-07-01
作品名稱 A new process capability analysis chart approach on the chip resistor quality management
作品名稱（其他語言）
著者 Ouyang, Liang-Yuh; Hsu, Chang-Hsien; Yang, Chun-Ming
單位 淡江大學管理科學學系
出版者 London: Sage Publications Ltd.
著錄名稱、卷期、頁數 Journal of Engineering Manufacture 227(7), pp.1075-1082
摘要 Process capability indices have been extensively used to determine whether the quality characteristics of the product meet the preset targets of the customer in manufacturing industries. However, these existing process capability indices cannot categorically determine improvement priorities for substandard quality characteristics. Besides, process capability indices also cannot effectively identify and measure deficiencies in process capability owing to accuracy, precision, or both. In this study, we combine the process capability index Cpm , minimum individual process capability C 0, accuracy A, and precision P to develop a new process capability analysis chart. Managers can apply process capability analysis chart to identify the substandard quality characteristics of the product. Furthermore, if the budget for all substandard quality characteristics improvements is limited, we use the discrimination distance method to measure and determine improvement priorities for substandard quality characteristics. Moreover, we construct an implementation flowchart of the process capability analysis chart to derive the results easily. Finally, an example of a chip resistor is presented to illustrate the applicability of the process capability analysis chart for manufacturing quality management.
關鍵字 Accuracy;discrimination distance;precision;process capability analysis chart;process capability indices
語言 en
ISSN 0954-4054
期刊性質 國外
收錄於 SCI
產學合作
通訊作者 Hsu, Chang-Hsien
審稿制度 是
國別 GBR
公開徵稿
出版型式 紙本
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