Electronic properties of the diamond films with nitrogen impurities: An x-ray absorption and photoemission spectroscopy study
學年 89
學期 1
出版（發表）日期 2000-12-01
作品名稱 Electronic properties of the diamond films with nitrogen impurities: An x-ray absorption and photoemission spectroscopy study
作品名稱（其他語言）
著者 Chang, Y. D.; Chiu, A. P.; Pong, W. F.; Tsai, M. H.; Chang, Y. K.; Chen, Y. Y.; Chiou, J. W.; Jan, C. J.; Tseng, P. K.; Wu, R. T.; Chung, S. C.; Tsang, K. L.; Lin, I. N.; Cheng, H. F.
單位 淡江大學物理學系
出版者 College Park: American Institute of Physics
著錄名稱、卷期、頁數 Applied Physics Letters 77(26), pp.4362-4364
摘要 X-ray absorption near-edge structure (XANES) measurements have been performed for nitrogen (N) containing diamond films with three different N concentrations at the C K-edge using the sample drain current mode. The C K-edge XANES spectra of these diamond films resemble that of the pure diamond regardless of the N concentration, which suggests that the overall bonding configuration of the C atom is unaltered. N impurities are found to reduce the intensities of both the sp2- and sp3-bond derived resonance features in the XANES spectra. The valence-band photoelectron spectra indicate that N atoms cause the broadening of the valence band σ- and π-bond features and the enhancement and reduction of the σ- and π-bond features, respectively.
關鍵字
語言 en
ISSN 1077-3118 0003-6951
期刊性質 國外
收錄於
產學合作
通訊作者 Pong, W. F.
審稿制度
國別 USA
公開徵稿
出版型式 紙本 電子版
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