Assessing the lifetime performance index of exponential products with step-stress accelerated life-testing data
學年 101
學期 2
出版（發表）日期 2013-03-01
作品名稱 Assessing the lifetime performance index of exponential products with step-stress accelerated life-testing data
作品名稱（其他語言）
著者 Lee, Hsiu-Mei; Wu, Jong-Wuu; Lei, Chia-Ling
單位 淡江大學統計學系
出版者 Piscataway: Institute of Electrical and Electronics Engineers
著錄名稱、卷期、頁數 IEEE Transactions on Reliability 62(1), pp.296-304
摘要 Lifetime performance assessment has been crucial to the manufacturing industry. In practice, a lifetime performance index CL is used to measure the larger-the-better type quality characteristics. Accelerated life test (ALT) has often been used to yield information quickly so that the life distribution of products can be estimated. This study constructs a maximum likelihood estimator (MLE) of CL for exponential products based on type II right censored data from the step-stress accelerated life test (SSALT). The MLE of CL is then utilized to develop the hypothesis testing procedure with the given lower specification limit L . This new testing procedure can be easily applied to assess whether the lifetime of products meets the requirements. Finally, we give two examples to explicate the proposed testing procedures.
關鍵字 Hypothesis testing procedure; lifetime performance index; maximum likelihood estimator; step-stress accelerated life test; type II right censored data
語言 en_US
ISSN 1558-1721
期刊性質 國外
收錄於 SCI
產學合作
通訊作者 Lee, Hsiu-Mei
審稿制度 是
國別 USA
公開徵稿
出版型式 ,電子版,紙本
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