Modeling reconstruction of coupled transmission lines using time-domain characterization in high-speed digital system | |
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學年 | 91 |
學期 | 1 |
發表日期 | 2003-05-11 |
作品名稱 | Modeling reconstruction of coupled transmission lines using time-domain characterization in high-speed digital system |
作品名稱(其他語言) | |
著者 | Liu, Huang-chieh; Hsu, Show-gwo; Lee, Yu-shu; Chiu, Chien-ching |
作品所屬單位 | 淡江大學電機工程學系 |
出版者 | New York: Institute of Electrical and Electronics Engineers (IEEE) |
會議名稱 | EMC '03. 2003 IEEE International Symposium on Electromagnetic Compatibility |
會議地點 | Istanbul, Turkey |
摘要 | A novel method is developed to reconstruct the physically structures of a nonuniform couple transmission lines from layer peeling algorithm and genetic algorithm. Base on the time domain reflection (TDR) measurement, the impedance profile of the device under test (D.U.T) is first derived by layer peeling transmission line synthesis. Then, the genetic algorithm (G.A.) is employed to extract the parameter of the lumped/distributed circuits in high-speed digital circuit. As a result, the system characteristic can be easily obtained by the extracted model and SPICE circuit simulation software. |
關鍵字 | |
語言 | en |
收錄於 | |
會議性質 | 國際 |
校內研討會地點 | |
研討會時間 | 20030511~20030516 |
通訊作者 | |
國別 | TUR |
公開徵稿 | |
出版型式 | |
出處 | Electromagnetic Compatibility, 2003. EMC '03. 2003 IEEE International Symposium on (Volume:1 ), pp.304-307 |
相關連結 |
機構典藏連結 ( http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/38527 ) |