教師資料查詢 | 類別: 期刊論文 | 教師: 張經霖 CHANG, HENRY CHING-LIN (瀏覽個人網頁)

標題:Soft X-ray characterization of Zn1−xSnxOy electronic structure for thin film photovoltaics
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學期
出版(發表)日期2012/06/21
作品名稱Soft X-ray characterization of Zn1−xSnxOy electronic structure for thin film photovoltaics
作品名稱(其他語言)
著者Mukes Kapilashrami; Coleman X. Kronawitter; Tobias Törndahl; Johan Lindahl; Adam Hultqvist; Wei-Cheng Wang; Chang, Ching-Lin; Samuel S. Mao; Jinghua Guo
單位淡江大學物理學系
出版者Cambridge: R S C Publications
著錄名稱、卷期、頁數Physical Chemistry Chemical Physics 14, p.10154-10159
摘要Zinc tin oxide (Zn1−xSnxOy) has been proposed as an alternative buffer layer material to the toxic, and light narrow-bandgap CdS layer in CuIn1−x,GaxSe2 thin film solar cell modules. In this present study, synchrotron-based soft X-ray absorption and emission spectroscopies have been employed to probe the densities of states of intrinsic ZnO, Zn1−xSnxOy and SnOx thin films grown by atomic layer deposition. A distinct variation in the bandgap is observed with increasing Sn concentration, which has been confirmed independently by combined ellipsometry-reflectometry measurements. These data correlate directly to the open circuit potentials of corresponding solar cells, indicating that the buffer layer composition is associated with a modification of the band discontinuity at the CIGS interface. Resonantly excited emission spectra, which express the admixture of unoccupied O 2p with Zn 3d, 4s, and 4p states, reveal a strong suppression in the hybridization between the O 2p conduction band and the Zn 3d valence band with increasing Sn concentration.
關鍵字Mukes Kapilashrami;Coleman X. Kronawitter;Tobias Törndahl;Johan Lindahl;Adam Hultqvist;Wei-Cheng Wang;Chang, Ching-Lin;Samuel S. Mao;Jinghua Guo
語言英文
ISSN1463-9084
期刊性質國外
收錄於SCI;
產學合作
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國別英國
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