教師資料查詢 | 類別: 期刊論文 | 教師: 蔡志群CHIH-CHUN TSAI (瀏覽個人網頁)

標題:Optimal Design for Gamma Degradation Processes with Random Effects
學年100
學期2
出版(發表)日期2012/06/01
作品名稱Optimal Design for Gamma Degradation Processes with Random Effects
作品名稱(其他語言)
著者Tsai, Chih-chun; Tseng, Sheng-tsaing; Narayanaswamy Balakrishnan
單位淡江大學數學學系
出版者Piscataway: Institute of Electrical and Electronics Engineers
著錄名稱、卷期、頁數IEEE Transactions on Reliability 61(2), pp.604-613
摘要Degradation models are usually used to provide information about the reliability of highly reliable products that are not likely to fail within a reasonable period of time under traditional life tests, or even accelerated life tests. The gamma process is a natural model for describing degradation paths, which exhibit a monotone increasing pattern, while the commonly used Wiener process is not appropriate in such a case. We discuss the problem of optimal design for degradation tests based on a gamma degradation process with random effects. To conduct a degradation experiment efficiently, several decision variable (such as the sample size, inspection frequency, and measurement numbers) need to be determined carefully. These decition variables affect not only the experimental cost, but also the precision of the estimates of lifetime parameters of interest. Under the constraint that the total experimental cost does not exceed a pre-specified budget, the optimal decision variables are found by minimizing the asymptotic variance of the estimate of the 100p-th percentile of the lifetime distribution of the product. Laser data are used to illustrate the proposed method. Moreover, we assess analytically the effects of model mis-specification that occur when the random effects are not taken into consideration in the gamma degradation model.The numerical results of these effects reveal that the impact of model mis-specification on the accuracy and precision of prediction of percentiles of the lifetimes of products are somewhat serious for the tail probabilities. A simulation study also shows that the simulated values are quite close to the asymptotic values.
關鍵字Asymptotic normality; gamma process; model
mis-specification; optimal design; random effects
語言英文
ISSN0018-9529
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收錄於SCI
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國別美國
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