Inference from lumen degradation data under Wiener diffusion process
學年 100
學期 2
出版（發表）日期 2012-07-13
作品名稱 Inference from lumen degradation data under Wiener diffusion process
作品名稱（其他語言）
著者 Tsai, Tzong-ru; Lin, Chin-wei; Sung, Yi-ling; Chou, Pei-ting; Chen, Chiu-ling; Lio, Yuh-long
單位 淡江大學統計學系
出版者 IEEE Reliability Society
著錄名稱、卷期、頁數 IEEE Transactions on Reliability 61(3), p.710-718
摘要 The lumen degradation of light emitting diodes subject to increasing stress loading is investigated by using a cumulative damage model. The cumulative damage process is taken as a Wiener diffusion process with a drift which depends on two stress loadings. General statistical inferences on the parameters and percentiles of the light emitting diode lifetime distribution are presented based on the cumulative damage measurements, collected from a two-variable constant-stress loading accelerated degradation test. Approximate lower s-confidence bounds of the light emitting diode lighting lifetime percentiles are given using the Fisher information of the maximum-likelihood estimators, and Bonferroni's inequality. The application of the proposed method is illustrated by a lumen cumulative damage data set of high power light emitting diodes.
關鍵字 Degradation;Loading;Stress;Load modeling;Maximum likelihood estimation;Light emitting diodes;Reliability
語言 en_US
ISSN 0018-9529
期刊性質 國外
收錄於 SCI
產學合作
通訊作者 Lio, Yuh-long
審稿制度 是
國別 USA
公開徵稿
出版型式 ,電子版
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