Planning step-stress test plans under Type-I censoring for the log-location-scale case
學年 100
學期 2
出版（發表）日期 2012-03-01
作品名稱 Planning step-stress test plans under Type-I censoring for the log-location-scale case
作品名稱（其他語言）
著者 Lin, Chien-Tai; Chou, Cheng-Chieh; Balakrishnan, N.
單位 淡江大學數學學系
出版者 Abingdon: Taylor & Francis
著錄名稱、卷期、頁數 Journal of Statistical Computation and Simulation 83(10), pp.1852-1867
摘要 In this paper, we consider a k-level step-stress accelerated life-testing (ALT) experiment with unequal duration steps τ=(τ1, …, τ k ). Censoring is allowed only at the change-stress point in the final stage. A general log-location-scale lifetime distribution with mean life which is a linear function of stress, along with a cumulative exposure model, is considered as the working model. Under this model, the determination of the optimal choice of τ for both Weibull and lognormal distributions are addressed using the variance–optimality criterion. Numerical results show that for a general log-location-scale distributions, the optimal k-step-stress ALT model with unequal duration steps reduces just to a 2-level step-stress ALT model.
關鍵字 accelerated life;reliability;censored data;distributed computations;Weibull and similar distributions;maximum likelihood;optimization
語言 en_US
ISSN 1563-5163
期刊性質 國外
收錄於 SCI
產學合作
通訊作者 Lin, Chien-tai
審稿制度 否
國別 USA
公開徵稿
出版型式 ,電子版
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