Electronic states and structural characterization in single-crystal Fe-Ni-O alloy thin films grown by molecular beam epitaxy
學年 87
學期 1
出版(發表)日期 1999-01-01
作品名稱 Electronic states and structural characterization in single-crystal Fe-Ni-O alloy thin films grown by molecular beam epitaxy
作品名稱(其他語言)
著者 Chang, C.L.; Chern, G.; Chen, C.L.; Hsieh, H.H.; Dong, C.L.; 彭維鋒; Pong, Way-faung; Chao, C.H.; Chien, H.C.; Chang, S.L.; 張經霖
單位 淡江大學物理學系
出版者
著錄名稱、卷期、頁數 Solid state communications 109(9), pp.599-604
摘要 High quality epitaxial Fe3O4, NiO and a series of Fe1−xNixOy (0<x<1) thin films have been fabricated by molecular beam epitaxy. In situ reflection high energy electron diffraction (RHEED), ex situ X-ray diffraction (XRD), and X-ray absorption spectroscopy (XAS) studies have been carried out. It was observed that the crystal structure of all the Fe1−xNixOy films studied resemble that of the inverse spinel Fe3O4. The lattice spacing along the perpendicular direction as a function of x shows a minimum at x=0.5 instead of a linear variation indicating that the structures are different from a bulk ferrite Fe2NiO4-like phase. The XAS results are consistent with XRD results and further identify the cation distribution in Fe1−xNixOy system as x varies. The mechanism of the formation of the metastable phase and its implication on the magnetic properties of these Fe–Ni–O films are briefly discussed.
關鍵字 A. Thin films;C. NEXAFS;C. X-ray scattering;E. Synchrotron radiation
語言 en
ISSN
期刊性質 國內
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