| Effect of swift heavy ions in Ni–Al nanocrystalline films studied by X-ray absorption spectroscopy | |
|---|---|
| 學年 | 96 | 
| 學期 | 1 | 
| 出版(發表)日期 | 2008-01-10 | 
| 作品名稱 | Effect of swift heavy ions in Ni–Al nanocrystalline films studied by X-ray absorption spectroscopy | 
| 作品名稱(其他語言) | |
| 著者 | Tsai, H.-M.; Bao, C.-W.; Chiou, J.-W.; Pong, W.-F. | 
| 單位 | 淡江大學物理學系 | 
| 出版者 | Elsevier BV | 
| 著錄名稱、卷期、頁數 | Spectrochimica Acta Part A: Molecular and Biomolecular Spectroscopy Pages 70(2), p.454–457 | 
| 摘要 | X-ray absorption spectroscopic measurements have been used to compare the electronic structures of swift heavy ions (100 MeV Si ions) irradiated and pristine Ni–Al nanocrystalline films. Results from X-ray diffraction (XRD), X-ray absorption near-edge structure (XANES) spectra at Al K-, and Ni L2,3-edges and extended X-ray absorption fine structure (EXAFS) at Ni K-edges are discussed. The observed XRD peaks indicate the improvement of crystalline nature and Al(1 1 1) clustering after the swift heavy ion interactions. While the XANES spectra at Ni L2,3-edges show decrease in the intensity of white line strength, the Al K-edge shows increase in intensity after irradiation. Above results imply that swift heavy ions induce low Z (i.e., Al) ion mass transport, changes in Al sp-Ni–d hybridization, and charge transfer. EXAFS results show that crystalline nature is improved after swift heavy irradiation which is consistent with XRD results. | 
| 關鍵字 | |
| 語言 | en_US | 
| ISSN | 1873-3557 | 
| 期刊性質 | 國外 | 
| 收錄於 | |
| 產學合作 | |
| 通訊作者 | Asokan, K. | 
| 審稿制度 | 否 | 
| 國別 | NLD | 
| 公開徵稿 | |
| 出版型式 | ,電子版,紙本 | 
| 相關連結 | 機構典藏連結 ( http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/72592 ) |