教師資料查詢 | 類別: 期刊論文 | 教師: 韋伯韜 WEI, PO-TAO (瀏覽個人網頁)

標題:Goodness-of-Fit Test-Statistics on Gaussian and Exponential Reliability Data
學年
學期
出版(發表)日期1912/01/01
作品名稱Goodness-of-Fit Test-Statistics on Gaussian and Exponential Reliability Data
作品名稱(其他語言)
著者Wei, Duan; Chen, C.Y.
單位淡江大學財務金融學系
出版者
著錄名稱、卷期、頁數IEEE Tran. reliability R32(5), pp.492-495
摘要The paper presents three statisics for testing s-normality and one statistic for testing exponentiality in system reliability data. The distributions of these statistics were approximated by using Monte Carlo simulation. The power of these statistics is investigated with respect to several alternatives. For testing small sample s- normality, two of them, namely, the newly proposed Lilliefors type statistic and sample skewness coefficient have very good power.
關鍵字Power comparison;Goodness-of-fit test statistic;Gaussian distribution;Exponential distribution
語言英文
ISSN
期刊性質國內
收錄於
產學合作
通訊作者
審稿制度
國別中華民國
公開徵稿
出版型式,電子版
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