教師資料查詢 | 類別: 會議論文 | 教師: 饒建奇 Jiann-chyi Rau (瀏覽個人網頁)

標題:Design of Dynamically Assignmentable TAM Width for Testing Core-Based SOCs
學年
學期
發表日期2006/12/04
作品名稱Design of Dynamically Assignmentable TAM Width for Testing Core-Based SOCs
作品名稱(其他語言)
著者Rau, Jiann-Chyi; Chen, Chien-Shiun; Wu, Po-Han
作品所屬單位淡江大學電機工程學系
出版者
會議名稱Circuits and Systems, 2006. APCCAS 2006. IEEE Asia Pacific Conference on
會議地點Singapore
摘要Test access mechanism (TAM) and testing schedule for system-on-chip (SOC) are challenging problems. Testing schedule must be effective to minimize testing time, under the constraint of test resources. This paper presents a new method based on generalized rectangle packing, as two-dimensional packing. A core cuts into many pieces and utilizes the design of reconfigurable core wrappers, and is dynamic to change the width of the TAM executing the core test. Therefore, a core can utilize different TAM width to complete test
關鍵字SOC Testing;TAM;Testing Scheduling
語言英文
收錄於
會議性質國際
校內研討會地點
研討會時間20061204~20061207
通訊作者
國別新加坡
公開徵稿Y
出版型式
出處Circuits and Systems, 2006. APCCAS 2006. IEEE Asia Pacific Conference on, pp.1399-1402
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