教師資料查詢 | 類別: 會議論文 | 教師: 饒建奇 Jiann-chyi Rau (瀏覽個人網頁)

標題:Reducing Switching Activity by Test Slice Difference Technique for Test Volume Compression
學年
學期
發表日期2009/05/24
作品名稱Reducing Switching Activity by Test Slice Difference Technique for Test Volume Compression
作品名稱(其他語言)
著者Li, Wei-Lin; Wu, Po-Han; Rau, Jiann-Chyi
作品所屬單位淡江大學電機工程學系
出版者IEEE Circuits and Systems Society; National Cheng Kung University
會議名稱
會議地點Taipei, Taiwan
摘要This paper presents a test slice difference (TSD) technique to improve test data compression. It is an efficient method and only needs one scan cell. Consequently, hardware overhead is much lower than cyclical scan chains (CSR). As the complexity of VLSI continues to grow, excessive power supply noise has become seriously. We propose a new compression scheme which smooth down the switching activity and reduce the test data volume simultaneously.
關鍵字
語言英文
收錄於
會議性質國際
校內研討會地點
研討會時間
通訊作者
國別中華民國
公開徵稿
出版型式
出處Proc. of IEEE International Symposium on Circuits and Systems (ISCAS), pp.2986-2989
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