Progressively interval-censored life test with acceptance sampling | |
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學年 | 96 |
學期 | 2 |
發表日期 | 2008-06-18 |
作品名稱 | Progressively interval-censored life test with acceptance sampling |
作品名稱(其他語言) | |
著者 | Tsai, Tzong-ru; Lin, Kuang-Nan; Chiang, Jyun-You; Fan, Hsaio-Ching |
作品所屬單位 | 淡江大學統計學系 |
出版者 | IEEE Computer Society etc. |
會議名稱 | Third International Conference on Innovation Computing, Information and Control 2008 |
會議地點 | Dalian, China |
摘要 | Considering the producer and consumer risks, the paper develops acceptance sampling procedures under the progressively interval-censored test with intermittent inspections for the exponential lifetime model. The proposed approach allows removing surviving items during the life test such that some extreme lifetimes can be sought, or the test facilities can be freed up for other tests. A reduction in testing effort and administrative convenience can be achieved by employing the proposed approach. One example is introduced for illustration. |
關鍵字 | |
語言 | en |
收錄於 | |
會議性質 | 國際 |
校內研討會地點 | |
研討會時間 | 20080618~20080620 |
通訊作者 | |
國別 | CHN |
公開徵稿 | |
出版型式 | |
出處 | Third International Conference on Innovation Computing, Information and Control 2008, Dalian, China, pp.129 |
相關連結 |
機構典藏連結 ( http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/60299 ) |
SDGS | 優質教育 |