Advanced field-measurement method with three orthogonal Hall probes for an elliptically polarizing undulator
學年 86
學期 2
出版（發表）日期 1998-05-01
作品名稱 Advanced field-measurement method with three orthogonal Hall probes for an elliptically polarizing undulator
作品名稱（其他語言）
著者 Hwang, C. S.; Fan, T. C.; Lin, F. Y.; Yeh, Shuting; Chang, C. H.; Chen, H. H.; 鄭伯昆; Tseng, P. K.
單位 淡江大學物理學系
出版者 International Union of Crystallography
著錄名稱、卷期、頁數 Journal of Synchrotron Radiation 5(3), pp.471-474
摘要 link to html Advanced field-measurement method with three orthogonal Hall probes for an elliptically polarizing undulator C.-S. Hwang, T. C. Fan, F. Y. Lin, S. Yeh, C. H. Chang, H. H. Chen and P. K. Tseng A three-orthogonal-Hall-probe assembly with an `on the fly' mapping method has been developed to characterize an elliptically polarizing undulator (EPU). The underlying design concept is that it can measure the three real field components without any field correction under a reliable and synchronization measurement method. Therefore, the relative central position shift, orthogonal angle and the planar Hall effect error between the three Hall probes should be calibrated and readjusted. Experimental results demonstrate that this method can yield an r.m.s. reproducibility of 10 G cm for the three field components and 2 G for the peak field strength. Under precision conditions this system can completely measure the three on-axis field components within 2 min for a 4 m-long EPU.
關鍵字 elliptically polarizing undulators;three-orthogonal-Hall-probe assembly;planar Hall effect
語言 en
ISSN 0909-0495 1600-5775
期刊性質 國外
收錄於
產學合作
通訊作者
審稿制度 否
國別 GBR
公開徵稿
出版型式 ,電子版,紙本
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