Effect of the annealing temperature on the electronic and atomic structures of exchange-biased NiFe-FeMn bilayers | |
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學年 | 90 |
學期 | 2 |
出版(發表)日期 | 2002-02-01 |
作品名稱 | Effect of the annealing temperature on the electronic and atomic structures of exchange-biased NiFe-FeMn bilayers |
作品名稱(其他語言) | |
著者 | Lee, J. M.; Jan, J. C.; Chiou, J. W.; 彭維鋒; Pong, W. F.; Tsai, M.-H.; Chang, Y. K.; Chen, Y. Y.; Wang, C. R.; Lee, J. F.; Yang, T.; Lu, Z.; Lai, W. Y.; Mai, Z. H. |
單位 | 淡江大學物理學系 |
出版者 | World Scientific Publishing |
著錄名稱、卷期、頁數 | Surface Review and Letters 9(1), pp.293-298 |
摘要 | In this study we measured the Fe, Mn, and Ni L2,3-edge X-ray absorption near-edge structure (XANES) and K-edge extended X-ray absorption fine structure (EXAFS) of the ferromagnetic (FM) NiFe and antiferromagnetic (AFM) FeMn bilayer films prepared with various annealing temperatures. The branching ratios of the white-line intensities in the Fe, Mn, and Ni L2,3-edges XANES spectra and consequently the magnetic properties of these exchange-biased FM NiFe - AFM FeMn bilayers are found to depend strongly on the annealing temperature. We find that the first peak in the Fe, Mn, and Ni K-edge EXAFS Fourier transform spectra are very similar, which suggests that the nearest-neighbor bond lengths among Fe, Mn, and Ni atoms are essentially the same in the NiFe–FeMn bilayers. However, the peaks at distances greater than ~ 3 Å appear to be sensitive to the annealing temperature especially for the Fe and Mn K-edge spectra, which suggests that annealing alters the atomic structures of the next-nearest-neighbor and more distant shells surrounding the Fe and Mn atoms in the NiFe–FeMn bilayers. |
關鍵字 | |
語言 | en |
ISSN | 0218-625X |
期刊性質 | 國外 |
收錄於 | |
產學合作 | |
通訊作者 | |
審稿制度 | 否 |
國別 | SGP |
公開徵稿 | |
出版型式 | ,電子版,紙本 |
相關連結 |
機構典藏連結 ( http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/27916 ) |