教師資料查詢 | 類別: 會議論文 | 教師: 衛信文 Wei, Hsin-Wen (瀏覽個人網頁)

標題:Boosting the Profitability of NVRAM-based Storage Devices via the Concept of Dual-Chunking Data Deduplication
學年108
學期1
發表日期2020/01/13
作品名稱Boosting the Profitability of NVRAM-based Storage Devices via the Concept of Dual-Chunking Data Deduplication
作品名稱(其他語言)
著者Shuo-Han Chen; Yu-Pei Liang; Yuan-Hao Chang; Hsin-Wen Wei; Wei-Kuan Shih
作品所屬單位
出版者
會議名稱ASP-DAC 2020
會議地點Beijing, China
摘要With the latest advance in the non-volatile random-access memory (NVRAM), NVRAM is widely considered as the mainstream for the next-generation storage mediums. NVRAM has numerous attractive features, which include byte addressability, limited idle energy consumption, and great read/write access speed. However, owing to the high manufacturing cost of NVRAM, the incentive of deploying NVRAM in consumer electronics is lowered due to the consideration of profitability. To resolve the profitability issue and bring the benefits of NVRAM into the design of consumer electronics, avoiding storing duplicate data on NVRAM becomes a crucial task for lowering the demand and deployment cost of NVRAM. Such observation motivates us to propose a data deduplication extended file system design (DeEXT) to boost the profitability of NVRAM via the concept of dual-chunking data deduplication while considering the characteristics of NVRAM and duplicate data content. The proposed DeEXT was then evaluated by real-world data deduplication traces with encouraging results.
關鍵字Random access memory;Nonvolatile memory;Power capacitors;Performance evaluation;Indexing;Consumer electronics;Three-dimensional displays
語言英文(美國)
收錄於
會議性質國際
校內研討會地點
研討會時間20200113~20200116
通訊作者
國別中國
公開徵稿
出版型式
出處2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC)
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