Planning Step-Stress Test Plans under Type-I Hybrid Censoring for the Log-Location-Scale Distribution
學年 108
學期 2
出版（發表）日期 2020-06-01
作品名稱 Planning Step-Stress Test Plans under Type-I Hybrid Censoring for the Log-Location-Scale Distribution
作品名稱（其他語言）
著者 Chien-Tai Lin; Cheng-Chieh Chou; N. Balakrishnan
單位
出版者
著錄名稱、卷期、頁數 Statistical Methods & Applications 29(2), p.265–288
摘要 The optimal design of a k-level step-stress accelerated life-testing (ALT) experiment with unequal duration steps under Type-I hybrid censoring scheme for a general log-location-scale lifetime distribution is discussed here. Censoring is allowed only at the change-stress point in the final stage. Based on the cumulative exposure model, the determination of the optimal choice for Weibull, lognormal and log-logistic lifetime distributions are considered by minimization of the asymptotic variance of the maximum likelihood estimate of the pth percentile of the lifetime at the normal operating condition. Numerical results show that for these lifetime distributions, the optimal k-step-stress ALT design with unequal duration steps under Type-I hybrid censoring scheme reduces just to a 2-step-stress ALT design.
關鍵字 Accelerated life-test;Cumulative exposure model;Fisher information matrix;Maximum likelihood method
語言 en
ISSN 1613-981X
期刊性質 國外
收錄於 SCI
產學合作
通訊作者 Chien-Tai Lin
審稿制度 是
國別 ITA
公開徵稿
出版型式 ,電子版
相關連結

機構典藏連結 ( http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/116901 )

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