教師資料查詢 | 類別: 會議論文 | 教師: 衛信文 Wei, Hsin-Wen (瀏覽個人網頁)

標題:Minimizing write amplification to enhance lifetime of large-page flash-memory storage devices
學年106
學期2
發表日期2018/06/24
作品名稱Minimizing write amplification to enhance lifetime of large-page flash-memory storage devices
作品名稱(其他語言)
著者Wei-Lin Wang; Tseng-Yi Chen; Yuan-Hao Chang; Hsin-Wen Wei; Wei-Kuan Shih
作品所屬單位
出版者
會議名稱Design Automation Conference, DAC 2018
會議地點San Francisco, CA
摘要Due to the decreasing endurance of ƒash chips, the lifetime of ƒash
drives has become a critical issue. To resolve this issue, various techniques
such as wear-leveling and error correction code have been
proposed to reduce the bit error rates of ƒash storage devices. In
contrast to these techniques, we observe that minimizing write ampli€cation
is another promising direction to enhance the lifetime of a
ƒash storage device. However, the development trend of large-page
ƒash memory exacerbates the write ampli€cation issue. In this work,
we present a compression-based management design to deal with
compressed data updates and internal fragmentation in ƒash pages.
‘us, it can minimize write ampli€cation by only updating the modi-
€ed part of ƒash pages with the support of data reduction techniques;
and the reduced write ampli€cation degree is more signi€cant when
the ƒash page size becomes larger due to the development trend. ‘is
design is orthogonal to wear-leveling and error correction techniques
and thus can cooperate with them to further enhance the lifetime of a
ƒash device. Based on a series of experiments, the results demonstrate
that the proposed design can e‚ectively improve the lifetime of a ƒash
storage device by reducing write ampli€cation.
關鍵字Compression-based FTL; large ƒash page; ƒash lifetime
語言英文
收錄於
會議性質國際
校內研討會地點
研討會時間20180624~20180628
通訊作者
國別美國
公開徵稿
出版型式
出處In the proceedings of DAC 116:1-116:6
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