Empirical Bayesian strategy for sampling plans with warranty under truncated censoring
學年 105
學期 1
出版（發表）日期 2016-09-28
作品名稱 Empirical Bayesian strategy for sampling plans with warranty under truncated censoring
作品名稱（其他語言）
著者 Jyun-You Chiang; Y.L. Lio; Tzong-Ru Tsai
單位
出版者
著錄名稱、卷期、頁數 International Journal of Reliability, Quality and Safety Engineering 23(5), p.1650021
摘要 To reach an optimal acceptance sampling decision for products, whose lifetimes are Burr type XII distribution, sampling plans are developed with a rebate warranty policy based on truncated censored data. The smallest sample size and acceptance number are determined to minimize the expected total cost, which consists of the test cost, experimental time cost, the cost of lot acceptance or rejection, and the warranty cost. A new method, which combines a simple empirical Bayesian method and the genetic algorithm (GA) method, named the EB-GA method, is proposed to estimate the unknown distribution parameter and hyper-parameters. The parameters of the GA are determined through using an optimal Taguchi design procedure to reduce the subjectivity of parameter determination. An algorithm is presented to implement the EB-GA method. The application of the proposed method is illustrated by an example. Monte Carlo simulation results show that the EB-GA method works well for parameter estimation in terms of small bias and mean square error.
關鍵字 Genetic algorithm;loss function;posterior density function;prior density function;truncated life test
語言 en
ISSN 0218-5393; 1793-6446
期刊性質 國外
收錄於 EI Scopus
產學合作
通訊作者 Tzong-Ru Tsai
審稿制度 否
國別 SGP
公開徵稿
出版型式 ,電子版
相關連結

機構典藏連結 ( http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/110017 )

SDGS 優質教育,產業創新與基礎設施