教師資料查詢 | 類別: 期刊論文 | 教師: 蔡宗儒 TZONG-RU TSAI (瀏覽個人網頁)

標題:Optimal two-variable accelerated degradation test plan for gamma degradation process
學年104
學期2
出版(發表)日期2016/03/01
作品名稱Optimal two-variable accelerated degradation test plan for gamma degradation process
作品名稱(其他語言)
著者Tzong-Ru Tsai; Wen-Yun Sung; Y. L. Lio; Shing I. Chang; Jye-Chyi Lu
單位
出版者
著錄名稱、卷期、頁數IEEE Transactions on Reliability 65(1), p.459-468
摘要An accelerated degradation test (ADT) can be used to assess the reliability of highly reliable products by using degradation information. In this study, to exhibit a monotone increasing pattern, the gamma process is used to model the degradation of a product subject to a constant-stress ADT of two loadings. Maximum likelihood estimates (MLEs) of the parameters of the ADT model were obtained. Given a budget for the total cost, an optimal ADT procedure was established to minimize the asymptotic variance of the MLE of the mean time to failure of a product, and the sample size and termination time of each run of the ADT at a constant measurement frequency were determined. An algorithm is provided to achieve an optimal ADT plan. An extensive Monte Carlo simulation was implemented to evaluate the sensitivity of the MLE variations to the sample size. A lumen degradation data set of light emitting diodes is presented to illustrate the proposed method.
關鍵字inverse Gaussian distribution;Bonferroni's inequality;Brownian motion process;cumulative exposure model;gamma process;geometric Brownian motion process
語言英文(美國)
ISSN0018-9529; 1558-1721
期刊性質國外
收錄於SCI;
產學合作
通訊作者
審稿制度
國別美國
公開徵稿
出版型式,電子版,紙本
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