教師資料查詢 | 類別: 期刊論文 | 教師: 蔡宗儒 TZONG-RU TSAI (瀏覽個人網頁)

標題:Degradation tests using geometric Brownian motion process for lumen degradation data
學年104
學期1
出版(發表)日期2015/12/01
作品名稱Degradation tests using geometric Brownian motion process for lumen degradation data
作品名稱(其他語言)
著者Jyun-You Chiang; Y.L. Lio; Tzong-Ru Tsai
單位
出版者
著錄名稱、卷期、頁數Quality and Reliability Engineering International 31(8), p.1797-1806
摘要Running a traditional life test over an affordable time period with highly reliable products is inefficient to collect the lifetime information of products even if the products are subject to higher stress conditions. This fact makes it difficult to infer the reliability of highly reliable products. The accelerated degradation test (ADT) method has been suggested as an alternative to infer the reliability of highly reliable product based on its degradation measurements. The current study is motivated by the statistical modeling of the lumen degradation date set of transistor outline can packaged light emitting diodes (LEDs). All degradation measurements were collected from an ADT, which was conducted with two stress loadings, the ambient temperature and drive current. To study the reliability of the LEDs under the ADT, the geometric Brownian motion process and generalized Eyring model are applied to estimate the distribution parameters and percentiles of the LEDs. Planning strategies of the sample size and measurement times for the proposed ADT are established to minimize the asymptotic variance of maximum-likelihood estimator of the lower 100pth percentile of LED lifetimes under the given budget. An algorithm is provided to reach the planning strategy. The guidelines of this study can be extended to infer the reliability of other highly reliable product besides LEDs.
關鍵字asymptotic variance;Fisher information;generalized Eyring model;maximum-likelihood estimation;stochastic process
語言英文
ISSN1099-1638
期刊性質國外
收錄於SCI;
產學合作
通訊作者Y.L. Lio
審稿制度
國別英國
公開徵稿
出版型式,電子版
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