教師資料查詢 | 類別: 期刊論文 | 教師: 林千代 Lin Chien-tai (瀏覽個人網頁)

標題:Lifetime Inference for Highly Reliable Products Based on Skew-Normal Accelerated Destructive Degradation Test Model
學年103
學期2
出版(發表)日期2015/04/14
作品名稱Lifetime Inference for Highly Reliable Products Based on Skew-Normal Accelerated Destructive Degradation Test Model
作品名稱(其他語言)
著者Tsai, Chih-Chun; Lin, Chien-Tai
單位
出版者
著錄名稱、卷期、頁數IEEE Transactions on Reliability 64(4), pp.1340-1355
摘要The accelerated destructive degradation test (ADDT) method provides an effective way to assess the reliability information of highly reliable products whose quality characteristics degrade over time, and can be taken only once on each tested unit during the measurement process. Conventionally, engineers assume that the measurement error follows the normal distribution. However, degradation models based on this normality assumption often do not apply in practical applications. To relax the normality assumption, the skew-normal distribution is adopted in this study because it preserves the advantages of the normal distribution with the additional benefit of flexibility with regard to skewness and kurtosis. Here, motivated by polymer data, we propose a skew-normal nonlinear ADDT model, and derive the analytical expressions for the product's lifetime distribution along with its corresponding 100pth percentile. Then, the polymer data are used to illustrate the advantages gained by the proposed model. Finally, we addressed analytically the effects of model mis-specification when the skewness of measurement error are mistakenly treated, and the obtained results reveal that the impact from the skewness parameter on the accuracy and precision of the prediction of the lifetimes of products is quite significant.
關鍵字model mis-specification; Accelerated destructive degradation tests; expectation-maximization algorithm; highly reliable products; skew-normal distribution
語言英文(美國)
ISSN0018-9529;1558-1721
期刊性質國外
收錄於SCI;
產學合作
通訊作者Lin, Chien-Tai
審稿制度
國別美國
公開徵稿
出版型式,電子版,紙本
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