Economic design of the life Test with a warranty policy
學年 103
學期 2
出版（發表）日期 2015-04-21
作品名稱 Economic design of the life Test with a warranty policy
作品名稱（其他語言）
著者 Tzong-Ru Tsai; N Jiang; YL Lio
單位
出版者
著錄名稱、卷期、頁數 Journal of Industrial and Production Engineering 32(4), p.225-231
摘要 Considering a warranty policy, an optimal truncated life test procedure is developed for the generalized exponential distribution. A total cost model, which involves the costs of testing, experimental time, lot acceptance or rejection, and the warranty, is adopted to establish the loss function of Bayesian decision method. A proper sample size of life test and an acceptance number of threshold are determined to minimize the expected total cost for lot decision. An example regarding the lifetime quality of integrated circuit products is used to demonstrate the proposed method. Numerical results have shown that the proposed method is beneficial for the reduction of expected total cost.
關鍵字 loss function;posterior density function;prior density function;truncated life test
語言 en_US
ISSN 2168-1015; 2168-1023
期刊性質 國外
收錄於 EI
產學合作
通訊作者 YL Lio
審稿制度 是
國別 USA
公開徵稿
出版型式 ,電子版
相關連結

機構典藏連結 ( http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/106158 )

SDGS 優質教育,產業創新與基礎設施