教師資料查詢 | 類別: 期刊論文 | 教師: 蔡宗儒 TZONG-RU TSAI (瀏覽個人網頁)

標題:Economic design of the life Test with a warranty policy
學年103
學期2
出版(發表)日期2015/04/21
作品名稱Economic design of the life Test with a warranty policy
作品名稱(其他語言)
著者Tzong-Ru Tsai; N Jiang; YL Lio
單位
出版者
著錄名稱、卷期、頁數Journal of Industrial and Production Engineering 32(4), p.225-231
摘要Considering a warranty policy, an optimal truncated life test procedure is developed for the generalized exponential distribution. A total cost model, which involves the costs of testing, experimental time, lot acceptance or rejection, and the warranty, is adopted to establish the loss function of Bayesian decision method. A proper sample size of life test and an acceptance number of threshold are determined to minimize the expected total cost for lot decision. An example regarding the lifetime quality of integrated circuit products is used to demonstrate the proposed method. Numerical results have shown that the proposed method is beneficial for the reduction of expected total cost.
關鍵字loss function;posterior density function;prior density function;truncated life test
語言英文(美國)
ISSN2168-1015; 2168-1023
期刊性質國外
收錄於EI;
產學合作
通訊作者YL Lio
審稿制度
國別美國
公開徵稿
出版型式,電子版
相關連結
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