On the Monitoring of Simple Linear Berkson Profiles | |
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學年 | 100 |
學期 | 1 |
出版(發表)日期 | 2012-01-10 |
作品名稱 | On the Monitoring of Simple Linear Berkson Profiles |
作品名稱(其他語言) | |
著者 | Wang, Yi-hua; Huwang, Long-cheen |
單位 | |
出版者 | |
著錄名稱、卷期、頁數 | Quality and Reliability Engineering International |
摘要 | We consider the quality of a process, which can be characterized by a simple linear Berkson profile. One existing approach for monitoring the simple linear profile and two new proposed schemes are studied for charting the simple linear Berkson profile. Simulation studies demonstrate the effectiveness and efficiency of one of the proposed monitoring schemes. In addition, a systematic diagnostic approach is provided to spot the change point location of the process and to identify the parameter of change in the profile. Finally, an example from semiconductor manufacturing is used to illustrate the implementation of the proposed monitoring scheme and diagnostic approach. Copyright © 2012 John Wiley & Sons, Ltd. |
關鍵字 | average run length;change point;control chart;EWMA;generalized likelihood ratio |
語言 | en |
ISSN | 1099-1638 |
期刊性質 | 國外 |
收錄於 | SCI SSCI |
產學合作 | |
通訊作者 | |
審稿制度 | 否 |
國別 | GBR |
公開徵稿 | |
出版型式 | ,電子版,紙本 |
相關連結 |
機構典藏連結 ( http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/104552 ) |