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標題:Structural characterization of the Co/Cr multilayers by x-ray-absorption spectroscopy
學年89
學期1
出版(發表)日期2000/10/01
作品名稱Structural characterization of the Co/Cr multilayers by x-ray-absorption spectroscopy
作品名稱(其他語言)
著者Liou, Y. H.; Pong, Way-faung; Tsai, M.-H.; Chang, K. H.; Hseih, H. H.; Chang, Y. K.; Chien, F. Z.; Tseng, P. K.; Lee, J. F.; Liou, Y.; Huang, J. C. A.
單位淡江大學物理學系
出版者College Park: American Physical Society
著錄名稱、卷期、頁數Physical Review B (Condensed Matter and Materials Physics) 62(14), pp.9616-9620
摘要We have performed Cr and Co K-edge x-ray-absorption measurements to investigate the dependence of local electronic and atomic structures on the Cr-layer thickness in epitaxial Co(11¯00) (40 Å)/Cr(211) (tCr) (tCr=2, 3, 5, 7, and 9 Å) multilayers. The Cr K x-ray-absorption near-edge fine structure (XANES) spectra of the Co/Cr multilayers indicate an abrupt transition of the Cr layer from hcp to bcc structure when the thickness of the Cr layer is increased to exceed ∼5 Å or three atomic layers. Our results offer an upper limit for the ability of the Co/Cr interface to stabilize the hcp structure in the thin Cr layer. The numbers of nearest-neighbor and next-nearest-neighbor atoms in the Cr and Co layers determined by extended x-ray-absorption fine-structure measurements performed at the Cr and Co K edge, respectively, are consistent with the XANES results.
關鍵字chromium;cobalt;absorption;absorption spectroscopy;atom;chemical structure;structure analysis;thickness;X ray analysis
語言英文
ISSN1098-0121
期刊性質國外
收錄於SCI
產學合作
通訊作者
審稿制度
國別美國
公開徵稿
出版型式紙本
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