教師資料查詢 | 類別: 會議論文 | 教師: 饒建奇 Jiann-chyi Rau (瀏覽個人網頁)

標題:The AB-Filling Methodology for Power-aware At-Speed Scan Testing
學年99
學期1
發表日期2010/10/31
作品名稱The AB-Filling Methodology for Power-aware At-Speed Scan Testing
作品名稱(其他語言)
著者Chen, Tsung-tang; Wu, Po-han; Chen, Kung-han; Rau, Jiann-chyi; Tzeng, Shih-ming
作品所屬單位淡江大學電機工程學系
出版者IEEE Computer Society Test Technology Thchnical Council; IEEE Philadelpjia Section
會議名稱2010 IEEE International Test Conference(ITC 2010)
會議地點Austin, Texas USA
摘要ATPG-based technique for reducing shift and capture power during scan testing is presented without any influence on fault coverage. This paper presents Adjacent Backtracing filling (AB-fillingl) which both adjacent and backtracing filling algorithms are used, is integrated in the ATPG algorithm to reduce capture power while feeding the first test pattern into CUT. After our approach for at-speed scan testing, all of test patterns have assigned as partially-specified values with a small number of don't care value (x) bits as in test compression, and it is a low capture power and considering the shift power test pattern. Experimental results for ISCAS'89 benchmark circuits show that the proposed scheme outperforms previous method in capture power.
關鍵字
語言英文
收錄於
會議性質國際
校內研討會地點
研討會時間20101031~20101105
通訊作者
國別
公開徵稿Y
出版型式紙本
出處Proceedings of 2010 IEEE International Test Conference (ITC), poster #7(1 pages)
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