The AB-Filling Methodology for Power-aware At-Speed Scan Testing
學年 99
學期 1
發表日期 2010-10-31
作品名稱 The AB-Filling Methodology for Power-aware At-Speed Scan Testing
著者 Chen, Tsung-tang; Wu, Po-han; Chen, Kung-han; Rau, Jiann-chyi; Tzeng, Shih-ming
作品所屬單位 淡江大學電機工程學系
出版者 IEEE Computer Society Test Technology Thchnical Council; IEEE Philadelpjia Section
會議名稱 2010 IEEE International Test Conference(ITC 2010)
會議地點 Austin, Texas USA
摘要 ATPG-based technique for reducing shift and capture power during scan testing is presented without any influence on fault coverage. This paper presents Adjacent Backtracing filling (AB-fillingl) which both adjacent and backtracing filling algorithms are used, is integrated in the ATPG algorithm to reduce capture power while feeding the first test pattern into CUT. After our approach for at-speed scan testing, all of test patterns have assigned as partially-specified values with a small number of don't care value (x) bits as in test compression, and it is a low capture power and considering the shift power test pattern. Experimental results for ISCAS'89 benchmark circuits show that the proposed scheme outperforms previous method in capture power.
語言 en
會議性質 國際
研討會時間 20101031~20101105
公開徵稿 Y
出版型式 紙本
出處 Proceedings of 2010 IEEE International Test Conference (ITC), poster #7(1 pages)

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