教師資料查詢 | 類別: 期刊論文 | 教師: 蔡志群 Chih-chun Tsai (瀏覽個人網頁)

標題:Optimal step-stress accelerated degradation test plan for gamma degradation processes
學年98
學期1
出版(發表)日期2009/12/01
作品名稱Optimal step-stress accelerated degradation test plan for gamma degradation processes
作品名稱(其他語言)
著者Tseng, Sheng-tsaing; Balakrishnan, N.; Tsai, Chih-chun
單位淡江大學數學學系
出版者IEEE Reliability Society
著錄名稱、卷期、頁數IEEE Transactions on Reliability 58(4), pp.611-618
摘要Step-stress accelerated degradation testing (SSADT) is a useful tool for assessing the lifetime distribution of highly reliable products (under a typical-use condition) when the available test items are very few. Recently, an optimal SSADT plan was proposed based on the assumption that the underlying degradation path follows a Wiener process. However, the degradation model of many materials (especially in the case of fatigue data) may be more appropriately modeled by a gamma process which exhibits a monotone increasing pattern. Hence, in practice, designing an efficient SSADT plan for a gamma degradation process is of great interest. In this paper, we first introduce the SSADT model when the degradation path follows a gamma process. Next, under the constraint that the total experimental cost does not exceed a pre-specified budget, the optimal settings such as sample size, measurement frequency, and termination time are obtained by minimizing the approximate variance of the estimated MTTF of the lifetime distribution of the product. Finally, an example is presented to illustrate the proposed method.
關鍵字
語言英文
ISSN0018-9529
期刊性質國外
收錄於SCI
產學合作
通訊作者
審稿制度
國別美國
公開徵稿
出版型式紙本
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