教師資料查詢 | 類別: 期刊論文 | 教師: 林千代 Lin Chien-tai (瀏覽個人網頁)

標題:Optimal Design for Accelerated Destructive Degradation Tests
學年101
學期1
出版(發表)日期2013/01/01
作品名稱Optimal Design for Accelerated Destructive Degradation Tests
作品名稱(其他語言)
著者Tsai, Chih-Chun; Tseng, Sheng-Tsaing; Balakrishnan, N.; Lin, Chien-Tai
單位淡江大學數學學系
出版者新竹市交通大學出版社
著錄名稱、卷期、頁數Quality Technology & Quantitative Management 10(3), pp.263-276
摘要Degradation tests are powerful and useful tools for lifetime assessment of highly reliable
products. In some applications, the degradation measurement process would destroy the physical
characteristic of units when tested at higher than usual stress levels of an accelerating variable such as
temperature, so that only one measurement can be made on each tested unit during the degradation
testing. An accelerated degradation test giving rise to such a degradation data is called an accelerated
destructive degradation test (ADDT). The specification of the size of the total sample, the frequency of
destructive measurements, the number of measurements at each stress level, and other decision variables
are very important to plan and conduct an ADDT efficiently. A wrong choice of these decision variables
may not only result in increasing the experimental cost, but may also yield an imprecise estimate of the
reliability of the product at the use condition. Motivated by a polymer data, this article deals with the
problem of designing an ADDT with a nonlinear model. Under the constraint that the total experimental
cost does not exceed a pre-fixed budget, the optimal test plan is obtained by minimizing the asymptotic
variance of the estimated 100 p th percentile of the product’s lifetime distribution at the use condition. A
sensitivity analysis is also carried out to examine the effects of changes in the decision variables on the
precision of the estimator of the 100 p th percentile. A simulation study further shows that the simulated
values are quite close to the asymptotic values when the sample sizes are large enough.
關鍵字Accelerated destructive degradation tests;arrhenius equation;highly reliable products, optimal test plan
語言英文(美國)
ISSN1684-3703
期刊性質國內
收錄於SCI;
產學合作
通訊作者Tseng, Sheng-Tsaing
審稿制度
國別中華民國
公開徵稿
出版型式,紙本
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