教師資料查詢 | 類別: 期刊論文 | 教師: 饒建奇 Jiann-chyi Rau (瀏覽個人網頁)

標題:Test Slice Difference Technique for Low-Transition Test Data Compression
學年100
學期2
出版(發表)日期2012/06/01
作品名稱Test Slice Difference Technique for Low-Transition Test Data Compression
作品名稱(其他語言)
著者Rau, Jiann-Chyi; Wu, Po-Han; Li, Wei-Lin
單位淡江大學電機工程學系
出版者Taipei: Tamkang University
著錄名稱、卷期、頁數Journal of Applied Science and Engineering 15(2), pp.157-166
摘要This paper presents a low power strategy for test data compression and a new decompression
scheme for test vectors. In our method, we propose an efficient algorithm for scan chain reordering to deal with the power dissipation problem. Further, we also propose a test slice difference (TSD) technique to improve test data compression. It is an efficient method and only needs one extra scan cell. In experimental results, the scheme that we presented achieve high compression ratio. The power consumption is also better compared with other well-known compression techniques.
關鍵字
語言英文(美國)
ISSN1560-6686
期刊性質國內
收錄於EI;
產學合作
通訊作者
審稿制度
國別中華民國
公開徵稿
出版型式,電子版
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