| Test Slice Difference Technique for Low-Transition Test Data Compression | |
|---|---|
| 學年 | 100 |
| 學期 | 2 |
| 出版（發表）日期 | 2012-06-01 |
| 作品名稱 | Test Slice Difference Technique for Low-Transition Test Data Compression |
| 作品名稱（其他語言） | |
| 著者 | Rau, Jiann-Chyi; Wu, Po-Han; Li, Wei-Lin |
| 單位 | 淡江大學電機工程學系 |
| 出版者 | Taipei: Tamkang University |
| 著錄名稱、卷期、頁數 | Journal of Applied Science and Engineering 15(2), p.157-166 |
| 摘要 | This paper presents a low power strategy for test data compression and a new decompression scheme for test vectors. In our method, we propose an efficient algorithm for scan chain reordering to deal with the power dissipation problem. Further, we also propose a test slice difference (TSD) technique to improve test data compression. It is an efficient method and only needs one extra scan cell. In experimental results, the scheme that we presented achieve high compression ratio. The power consumption is also better compared with other well-known compression techniques. |
| 關鍵字 | Test Data Compression;Low Power Testing;VLSI;Design for Testability (DFT) |
| 語言 | en_US |
| ISSN | 1560-6686 |
| 期刊性質 | 國內 |
| 收錄於 | EI |
| 產學合作 | |
| 通訊作者 | |
| 審稿制度 | 否 |
| 國別 | TWN |
| 公開徵稿 | |
| 出版型式 | ,電子版 |
| 相關連結 |
機構典藏連結 ( http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/81393 ) |
| SDGS | 產業創新與基礎設施 |
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