教師資料查詢 | 類別: 期刊論文 | 教師: 蔡宗儒 TZONG-RU TSAI (瀏覽個人網頁)

標題:Inference from lumen degradation data under Wiener diffusion process
學年100
學期2
出版(發表)日期2012/07/13
作品名稱Inference from lumen degradation data under Wiener diffusion process
作品名稱(其他語言)
著者Tsai, Tzong-ru; Lin, Chin-wei; Sung, Yi-ling; Chou, Pei-ting; Chen, Chiu-ling; Lio, Yuh-long
單位淡江大學統計學系
出版者IEEE Reliability Society
著錄名稱、卷期、頁數IEEE Transactions on Reliability 61(3), p.710-718
摘要The lumen degradation of light emitting diodes subject to increasing stress loading is investigated by using a cumulative damage model. The cumulative damage process is taken as a Wiener diffusion process with a drift which depends on two stress loadings. General statistical inferences on the parameters and percentiles of the light emitting diode lifetime distribution are presented based on the cumulative damage measurements, collected from a two-variable constant-stress loading accelerated degradation test. Approximate lower s-confidence bounds of the light emitting diode lighting lifetime percentiles are given using the Fisher information of the maximum-likelihood estimators, and Bonferroni's inequality. The application of the proposed method is illustrated by a lumen cumulative damage data set of high power light emitting diodes.
關鍵字Degradation;Loading;Stress;Load modeling;Maximum likelihood estimation;Light emitting diodes;Reliability
語言英文(美國)
ISSN0018-9529
期刊性質國外
收錄於SCI;
產學合作
通訊作者Lio, Yuh-long
審稿制度
國別美國
公開徵稿
出版型式,電子版
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