教師資料查詢 | 類別: 期刊論文 | 教師: 饒建奇 Jiann-chyi Rau (瀏覽個人網頁)

標題:Power-aware compression scheme for multiple scan-chain
學年99
學期2
出版(發表)日期2011/06/01
作品名稱Power-aware compression scheme for multiple scan-chain
作品名稱(其他語言)
著者Rau, Jiann-Chyi; Wu, Po-Han
單位淡江大學電機工程學系
出版者Abingdon: Taylor &; Francis Ltd.
著錄名稱、卷期、頁數Journal of the Chinese Institute of Engineers 34(4), pp.515-527
摘要As test data continues to grow quickly, test cost also increases. For the sake of decreasing the test cost, this article presents a new data dependency compression scheme for large circuit which is based on multiple scan chains. We propose new compression architecture with fixed length for running tests. In results, when the complexity of a VLSI circuit is growing, the number of input pins for testing is very low. Since test data in power aware is not changed frequently, we use a selector to filter the unnecessary status and buffers to hold the back data. We also propose a new algorithm to assign multiple scan chains and an improved linear dependency compute method to find the hidden dependency between scan chains. Experimental results show that the proposed method can reduce both test data volume and shift-in power.
關鍵字scan based testing; low power testing; test data compression; design for testability (DfT)
語言英文
ISSN0253-3839; 2158-7299
期刊性質國外
收錄於SCI
產學合作
通訊作者Rau, Jiann-Chyi
審稿制度
國別英國
公開徵稿
出版型式紙本;電子版
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